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You are here: Home / Instruments / FEM and TEM Plasma Cleaner

FEM and TEM Plasma Cleaner

                     

 

UV Sample Cleaner: ZONE SEM II

The ZONE II SEM Desktop Specimen Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

Specimen contamination can severely limit image quality and application utility of the scanning electron microscope. During sample preparation techniques through chemical or atmospheric interactions, hydrocarbons can non-covalently attach to the specimen surface. As the electron beam penetrates the specimen, the hydrocarbons can polymerize on the specimen surface. This formed layer alters the sample and interferes with SEM imaging. Cleaning the specimen surface by removing hydrocarbons prior to imaging yields better results and higher quality images.

The “ZONE II for SEM” utilizes vacuum-controlled UV irradiation and activated oxygen to gently and rapidly “clean” the specimen surface prior to imaging without the use of any chemicals, gases, or reagents.

 

UV Sample Cleaner: ZONE TEM II

The innovative ZONE TEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging. ZONE TEM II offers easy-to-use cleaning for pre-analysis sample preparation, ensuring the best possible data from our TEM samples.

Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM II desktop sample cleaner/desiccator gently removes that contamination to reveal the true surface of your specimens.

The ZONETEM II utilizes vacuum-controlled UV irradiation to gently and rapidly “clean” the specimen surface prior to imaging without the use of any chemicals, supply gases, or reagents.

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SEM and TEM Plasma Cleaners

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1617 Research Parkway
College Station, TX 77843

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