| Equipment | Status |
|---|---|
| Icon AFM | down |
| AFM-IR | down |
| Nanoindenter | up |
| Titan | up |
| PicoIndenter (SEM) | up |
| Tensile stage 500 N | up |
| Tensile stage 10 kN | up |
| FE-SEM | down |
| FIB Fera | up |
| FIB Lyra | down |
| Electron Microprobe | down |
| SIMS | up |
| UV-Vis-NIR | up |
| Spectrofluorometer | up |
| Raman | down |
| FTIR | up |
| XPS/UPS | down |
| Ellipsometer | up |
| Dielectric Spectrometer | up |
| DSC | down |
| TMA | down |
| Hot Disk | up |
| Optical | up |
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Materials Characterization Facility (MCF)
Frederick E. Giesecke Engineering Research Building
1617 Research Parkway
College Station, TX 77843
