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Fees

Instrument

Subsidized Peak Rate*

Subsidized Off-Peak Rate**

FE-SEM

$53.00/hr

$45.00/hr

FIB (FERA & LYRA)

$63.00/hr

$50.00/hr

Electron Microprobe

$63.00/hr***

$50.00/hr

Titan TEM

$95.00/hr

$75.00/hr

Ellipsometer

$23.00/hr

FTIR Spectrometer

$18.00/hr

Optical Microscope

$18.00/hr

Particle Size/Surface Area Analyzer

$32.00/hr

$25.00/hr

Raman Microscope

$34.00/hr

Spectrofluorometer

$20.00/hr

UV-Vis

$28.00/hr

AFM-IR

$35.00/hr

ICON AFM

$32.00/hr

$25.00/hr

Nanoindenter

$35.00/hr

$28.00/hr

XPS/UPS & EnviroESCA

$35.00/hr

$28.00/hr

CAMECA SIMS ION Microprobe

$200.00/sample***

Tensile Stages – (500N & 10kN)

$15.00/hr

Picoindenters (PI-85 & PI-95)

$15.00/run

Electropolishers (TenuPol & LectroPol)

$15.00/hr

Prep Lab

$10.00/hr

Sputter Coater

$14.00/hr

Gatan PIPS

$14.00/hr

Thermal Analysis (Dielectric, DSC, Hot Disk, TMA)

$18.00/hr

SEM/TEM Cleaning Stages

$12.00/hr

Sillicon wafer 4”

$12.00/ea

Sillicon wafer 3”

$9.00/ea

Sillicon wafer 2”

$7.00/ea

Pyrex glass wafer 3”

$20.00/ea

*Subsidized rates (TAMUS only):  Monday to Friday, 8 a.m. to 5 p.m.
**Subsidized off-peak rates (TAMUS only): 5 p.m. to 8 a.m.; Weekend rates: 5 p.m. Friday to 8 a.m. Monday
***These instruments are operated by MCF staff only and an additional charge of 1 hour of assisted time is charged to internal users for sample set up and calibration.  External users pay full amount of assisted time on these instruments.

The MCF rates are the result of a rate study of user facilities at other universities in the US and consultation with the MCF advisory committee.

TAMU users

Instrument use: rates listed above
Staff time for assisted work: $75/hr
Training: instrument rate + $55/hr (staff time)

Other universities, government agencies, nonprofit

Instrument rates: 150% of rates listed above
Staff time: $113/hr
*Non-TAMU users pay instrument rate + staff time for analysis.

Companies

Instrument rates: 300% of rates listed above
Staff time: $225/hr
*Non-TAMU users pay instrument rate + staff time for analysis.

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Materials Characterization Facility (MCF)

Frederick E. Giesecke Engineering Research Building
1617 Research Parkway
College Station, TX 77843

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