AFM

The MCF currently has a Digital Instruments Nanoscope AFM/STM for scanning probe microscopy.  The system is comprised of a Nanoscope III and a system controller fitted to a MultiMode TM scanhead.  We have the following capabilities:

• contact mode atomic force microscopy (CM-AFM)
• intermittent mode (tapping) atomic force microscopy (TM-AFM)
• scanning tunneling microscopy (STM)
• lateral force (friction) microscopy (LFM)
• imaging in a liquid environment
• variety of scanner sizes (few nanometers to tens of microns0
• sample heater (ambient up to 100 °C)

AFM Instructions (updated 12/5/2008)

For more information, go to www.veeco.com

To be trained on this instrument, please contact Dr. Gang Liang.