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Welcome to the Materials Characterization Facility

The Materials Characterization Facility (MCF) at Texas A&M University is a core user facility supported by the Office of the Vice President for Research, the College of Engineering/TEES and the College of Science. The MCF provides researchers in the TAMU community with access to high-end instrumentation essential for fundamental studies of the surface and interfacial properties of materials, such as ion and electron based spectroscopies, electron, optical and scanning probe microscopies. The MCF is staffed by research scientists with expertise in these areas, and they provide fundamental research training to students and faculty on our instrumentation as well as consolation of measurements needs and data interpretation. Beyond TAMU, the MCF also supports collaborative research projects with outside industrial users. Beyond research training, the facility also supports educational activities involving lab tours, workshops, hands on demonstrations, outreach and broader impact related activities through our open house and lunchtime seminar series.

The Mission of the MCF is to train students to use state-of-the-art instrumentation in support of their research and educational goals and to provide infrastructure and centralized resources for faculty across campus who wish to apply for funding for new instrumentation that further enhances Materials Science and Engineering at TAMU.

MCF Spring 2017 Lunch Seminar Series

 

Please join us at the MCF for a lunch time seminar series this spring!


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Giesecke Engineering Research Building

The MCF completed its move into the Frederick E. Giesecke Engineering Research Building in June 2015. It is located at 1617 Research Parkway in Texas A&M University’s Research Park. Parking is available in the adjacent lot with a campus bus stop near the front of the building. The MCF is located on the 1st floor of the Frederick E. Giesecke Engineering Research Building in Research Park.

ERG 1st Floor Map

Equipment Status

Equipment Status
Icon AFM up
MultiMode AFM up
Nanoindenter up
FE-SEM up
FIB Fera up
FIB Lyra up
Electron Microprobe up
SIMS up
UV-Vis-NIR up
Spectrofluorometer up
Raman down
FTIR up
XPS down
Ellipsometer up
Confocal Microscope up
Dielectric Spectrometer up
DSC up
TMA up
DMA down
Hot Disk up