Training
In order to use the equipment in the MCF, users must be checked out on the instrument they wish to use. Please contact the MCF staff listed on each instrument's page to schedule training.
| Instrument | # of training sessions | duration of session |
|---|---|---|
| Clean Room | ||
| Spin coater | 1 | ≤ 1 hr |
| Mask aligner | 1 | ≤ 1 hr |
| Profilometer | 1 | ≤ 1 hr |
| Reactive ion etcher | 1 | ≤ 1 hr |
| Metal evaporation chamber | 2 | 2 hrs |
| 3-D microscope | 1 | ≤ 1 hr |
| Wire bonder | 1 | 1 hr |
| XPS | 4 or more | 4 hrs |
| AFM | 2 to 4 | 4 hrs |
| Nanoindenter | 2 to 4 | 4 hrs |
| Dip pen nanolithography | 2 to 4 | 4 hrs |
| Ellipsometer | 1 | 2-3 hrs |
| Spectrofluorometer | 1 | 2 hrs |
| UV-vis-NIR spectrophotometer | 1 | 2 hrs |
| Raman/FTIR confocal microscope | ||
| Raman spectra | 1 | 2 hrs |
| Raman imaging (after spectra training) | 1 | 2-4 hrs |
| FTIR | 1 | 1-2 hrs |
| Confocal microscopes | 2 | 3 hrs |
| FE-SEM | ||
| Basic training (1st time users) | 3 | 3-4 hrs |
| Basic training (prior SEM experience) | 2 | 2-2.5 hrs |
| Advanced training (EDS) | 1 | 1-1.5 hrs |
Cleanroom Training
Training for cleanroom instrumentation is tailored to fit the specific needs of the researcher.
XPS Training
Introduction to the physics of XPS, vacuum operation and safety, obtaining spectra, individual element detection on conductive samples, off-line data processing. Additional training per request for more advanced techniques (XPS imaging and elemental mapping, charge neutralization for insulating samples, angle-resolved XPS, small spot spectroscopy, automatic instrument operation).
AFM/STM Training
Basic operation of scanning probe microscopy, atomic force microscopy (AFM) and/or scanning tunneling microscopy (STM). Additional training per request for more advanced techniques.
Nanoindenter training
Introdution to SPM, basic operation of nanoindenter and analysis of data.
Dip Pen Nanolithography
Training varies according to user’s needs.
Ellipsometer Training
Introduction to ellipsometry, instrument configuration, laser safety precautions, mounting samples, aligning lasers, data acquisition, basic optical modeling techniques.
Spectrofluorometer Training
Introduction to fluorescence, instrument configuration, basic start up/shut down procedure, steady state spectrum acquisition. Lifetime and quantum yield training per request.
UV-Vis-NIR Spectrophotometer Training
Instrument configuration, basic start up/ shut down procedure, wavelength spectrum acquisition for solid or liquid stage (per user’s request), changing sample holder/detectors.
Raman Training
Introduction to Raman, instrument configuration, start up/shut down procedures, laser safety precautions, basic raman spectrum acquisition procedure, calibration procedure, switching lasers. Additional training per request for Raman imaging.
FTIR Training
Introduction to IR spectroscopy, instrument configuration, spectrum acquisition with ATR and ARO objectives.
Confocal Training
Basic introduction to the microscope, startup/shutdown procedures, fluorescence using the mercury lamp, and basic operation of the confocal software (beam settings, image optimization, and Z-stack acquisition). Additional training per request for advanced techniques such as FRET and FRAP.
FE-SEM Training
The training for SEM will be divided into two categories – basic and advanced training. The basic training will allow users to operate the SEM to generate images which will require 2 or 3 sessions depending on prior SEM experience of users. If users wish to use the Energy-dispersive x-ray spectroscopy (EDS), they will be required to take the advanced training once they have shown proficiency in the basic usage of the SEM. Users should always discuss their samples with staff before they begin training so that they can prepare their samples appropriately. FE-SEM Training Policies
