The Hysitron PI 95 instrument from Bruker is the full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM). With this side-entry instrument, it is not only possibly to image the mechanical response of nanoscale materials, but also to acquire load-displacement data simultaneously. Further, an integrated video interface allows for time synchronization between the load-displacement curve and the corresponding TEM video.
Specifications:
Max Force: 1 mN
Force Noise Floor: <0.2 μN
Max Displacement: 1 μm
Displacement Noise Floor: <1 nm
Fine Sample Positioning Range XYZ: 50 μm/50 μm/3 μm
Fine Sample Positioning Sensitivity XYZ: 2 nm / 2 nm / 0.1 nm
Coarse Sample Positioning Range XYZ: 750 μm/750 μm/5000 μm
Applications:
Indentation: a sharp cube corner transducer is used to indent a sample with either load or displacement control.
Compression: a flat end transducer is used to compress particles or pillars.
Push to Pull Tensile Test: three different stiffness values (15, 150, and 450 N/m) available for use with a variety of materials and sizes.
For more information, visit:
For training on this instrument, please contact Dr. Sisi Xiang.